Run the Standard Double-Pulse Test

Before you run Double-Pulse characterization tests, you must set the Global Settings, configure the System Hardware, and Calibrate the System.

A Standard Double-Pulse Test is a common method for characterizing WBG power transistors. In general, it characterizes the turn-on and turn-off behavior for different supply voltages and different current levels. Two power transistors are configured in a totem-pole configuration (also called a half-bridge configuration). The Low-Side transistor is referred to as the Device Under Test (DUT). For proper operation, the body diode of the High-Side transistor is mandatory and is also used for the Reverse Recovery test.

Use these Double-Pulse Test Modules and Oscilloscope Probes

The Standard DPT test uses the following Test Modules and Oscilloscope Probes:

  • N2819A 10:1 Differential Oscilloscope Probe for measuring Gate Current, IG.
  • PD1000-60002 Protection Probe for measuring ID.
  • N2873 10:1 Standard Oscilloscope Probe for measuring VGS .
  • 10076C 100:1 High Voltage Probe for measuring VDS on the DUT Module.

 

a. GaN devices require a special DUT Test Board and a software license. Contact Keysight for information.

Parameter Settings

After setting the test parameters, click the Start button to start the test.